Test and Measurement

Explosive growth in wideband communications and sensing across the frequency spectrum presents a tremendous challenge for system and device test, verification and characterization. 

Jariet’s high-performance IC transceivers deliver the performance, features, frequency range and bandwidth to tackle tough measurement requirements.   Using integrated ADCs, DACs and PLL/VCOs sampling as fast as 64GSPS, signals from 100MHz to 36GHz can be captured or generated from a single SDR (software-defined radio) IC. 

Upgrade your test solution today with Jariet’s leading edge wideband and ultra-high-frequency technology.  Contact us to discuss solutions at sales@jariettech.com.